Soumya Mandal, Ritesh Sachan, Amit Pandey

Advances in HEA-Based AM Components: Role of High-Resolution Microscopy

  • Mechanical Engineering
  • Mechanics of Materials
  • General Materials Science

Abstract This article explains how SEM, TEM, and atom probe tomography are being used in the development of additively manufactured high-entropy alloys (HEAs), revealing critical features such as anisotropic microstructure and metallurgical defects. It also discusses ongoing efforts to improve the predictability and analysis of HEA microstructure using data-driven approaches.

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