DOI: 10.1063/1.1143970 ISSN:
Calibration of atomic-force microscope tips
Jeffrey L. Hutter, John Bechhoefer- Instrumentation
Images and force measurements taken by an atomic-force microscope (AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure uses the AFM itself and does not require additional equipment.