DOI: 10.1002/pssa.202300337 ISSN:

Synthesis and Characterization of Solid‐Solution ReS2−xTex (0 ≤ x ≤ 1) Nanosheets

Shutaro Kawawa, Keitaro Tezuka, Yue Jin Shan
  • Materials Chemistry
  • Electrical and Electronic Engineering
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

ReS2 nanosheets have recently attracted attention because of their excellent electrocatalytic properties. It has also been reported that the electrocatalytic activity of solid‐solution ReS2−x Se x nanosheets was improved by tuning the bandgap structure through a solid‐solution with Se. However, Se has application limitations in that it is highly toxic. Thus, in this study, we focused on solid‐solution ReS2−x Te x nanosheets. We synthesized solid‐solution ReS2−x Te x (x = 0, 0.5, and 1.0) bulk by solid‐state reactions. The optical bandgaps of ReS2, ReS1.5Te0.5, and ReSTe were measured to be 1.29, 1.07, and 0.99 eV, respectively. Solid‐solution ReS2−x Te x (x = 0, 0.5, and 1.0) nanosheets were obtained by the ultrasonic exfoliation and Li‐intercalation exfoliation of the ReS2−x Te x bulks. The typical lateral sizes and thicknesses of the ReS2, ReS1.5Te0.5, and ReSTe nanosheets by ultrasonic exfoliation were 200 and 6 nm, 160 and 3 nm, and 600 and 2 nm, respectively. The typical lateral sizes and thicknesses of ReS2, ReS1.5Te0.5, and ReSTe nanosheets using the Li‐intercalation exfoliation method were 150 and 2 nm, 100 and 1 nm, and 100 and 1 nm, respectively. In the nanosheets obtained from both exfoliation methods, the lateral size was not composition‐dependent, and the thickness decreased with increasing x in ReS2−x Te x .

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